The complexity in the RF architecture at the mmWave frequencies presents several design validation and test challenges throughout R&D, DVT and production environments. This requires massive engineering effort, proves less cost-efficient and inhibits economies of scale when manufacturing. This demands a test solution that ensures quality device characterization while consistently improving test time efficiencies.
In the following video, you will see how LitePoint’s IQgig-5G, a fully integrated, single box, mmWave non-signaling test solution, can be easily scaled from R&D to production environments. This allows for easy correlation of measurement results from the lab to the factory floor. Along with IQfact5G, LitePoint’s high volume manufacturing, easy to use automation test tool, IQgig-5G makes it seamless to run multiple DUTs in parallel. It further maximizes tester resource utilization while increasing the overall manufacturing test throughput.