LitePoint Announces First Over-the-Air Test System for Bluetooth® Low Energy Devices
Breakthrough Innovation for Accelerating Times to Market for Bluetooth® Low Energy Devices
LitePoint®, a leading provider of wireless test solutions, announced today the release of the first over-the-air test solution for the characterization and verification of Bluetooth® low energy devices (also known as Bluetooth® Smart). The LitePoint Bluetooth® Advanced test system is a breakthrough for Bluetooth® low energy product developers as they strive to balance getting to market first, while ensuring the highest levels of quality.
“Bluetooth® low energy has become one of the most widely deployed wireless technologies on the market and its adoption shows no sign of slowing down. Winning the IoT race will come down to two things — getting there first, with the highest quality. LitePoint’s Bluetooth® Advanced is the only test solution on the market that is able to characterize and verify Bluetooth® low energy devices via over-the-air testing. This enables product developers to get their products to market quickly with assured quality because they can be tested fully assembled – ensuring the performance of all components, including the antenna,” said Adam Smith, Director of Product Marketing at LitePoint.
See the LitePoint Bluetooth® Advanced Test System at Blue University Live 2016.
September 22, 2016
Seoul, South Korea
September 27, 2016
Radisson Blu Royal Hotel
October 4, 2016
While the Bluetooth® Advanced solution is ideal for testing devices in manufacturing, it’s also designed for the lab during the design phase of product creation. Smith added, “To get to market fast, you first have to get your product out of the lab and into mass production. The Bluetooth® Advanced test solution is easy to implement, easy to use, and provides excellent insight into the RF performance, allowing product developers to optimize their design and get their product to market quickly. With Bluetooth® Advanced, product developers can focus on their product, not on how to test it.”